采用粉末稀释直接压片,在PW1400顺序式X-荧光光谱仪上测定了 15个稀土元素。通过电子计算机采用干扰系数扣除严重的谱线干扰,应用α系数校正复杂的基体效应,取得满意的结果。本文研究重点是选择了最佳仪器测量条件;测量出元素间的干扰系数及校正了背景影响;比较了三种基体校正数学模型的效果。分析精度:当含量小于2％时,优于 5％;含量大于2％时,优于?2％。分析速度较文献[5]提高三倍。 Fifteen rare earth elements were measured on PW1400 Sequential X-Fluorescence Spectrometer using direct powder tabletting. The interference factor was subtracted by the computer to eliminate the serious spectral interference, and the α-factor was used to correct the complex matrix effect and obtain satisfactory results. The emphasis of this paper is to select the best instrument measurement conditions; to measure the inter-element interference coefficient and to correct the background effect; and to compare the effects of three kinds of substrate calibration mathematical models. Analysis accuracy: Better than 5% when the content is less than 2%; Better than 2% when the content is more than 2%. The speed of analysis is three times higher than [5].