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In order to analyze the thermal characteristics of the cavity facet of a semiconductor laser,a home-built near-field scanning optical microscopy(NSOM) is employed to probe the topography of the facet.By comparing the topographic images of two samples under different DC current injections,we can find that the thermal characteristic is related to its lifetime.We show that it is possible to predict the lifetime of the semiconductor laser diode with nondestructive tests.
In order to analyze the thermal characteristics of the cavity facet of a semiconductor laser, a home-built near-field scanning optical microscopy (NSOM) is employed to probe the topography of the facet.By comparing the topographic images of two samples under different DC current injections, we can find that the thermal characteristic is related to its lifetime.We show that it is possible to predict the lifetime of the semiconductor laser diode with nondestructive tests.