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拟定了用熔融法制片、PW1400X射线荧光光谱仪测定钛白中铝、硅的分析方法。制样手续虽较常用的粉末直接压片麻烦,但可消除试样与人工合成粉末标准在粒度、结构等方面存在的明显差别,保证了分析的准确度。对SiO_2、Al_2O_3的测定下限均为0.1％,上限分别为5％和7％。含有3％Al_2O_3、2％SiO_2的试样的统计方法精密度,其变异系数均约为2％;加料回收率为90～110％。
The analytical method for the determination of aluminum and silicon in titanium dioxide by the melting method and PW1400 X-ray fluorescence spectrometer was proposed. Although the sample preparation procedure is more troublesome than direct pressing of powders, it can eliminate the obvious differences in particle size and structure between the sample and synthetic powder standards, and ensure the accuracy of the analysis. The lower limit of determination of SiO_2, Al_2O_3 is 0.1%, the upper limit were 5% and 7%. The precision of statistical method for samples containing 3% Al 2 O 3 and 2% SiO 2 was about 2%, and the recovery rate was 90% -110%.