论文部分内容阅读
研究光寻址电位传感器(LAPS)的器件噪声特性。通过对LAPS半导体场效应器件的结构分析,建立LAPS的理论模型,并进一步分析LAPS器件噪声信号的来源、种类及特性。以pH缓冲液中H离子浓度为检测对象,搭建基于NI采集卡和Labview环境的LAPS测试系统,对影响LAPS信号噪声特性的光源波长、光源调制频率、光源强度和Si衬底厚度等因素进行了仿真和实验研究。结果表明,增大光源波长和光源强度是提高输出信号幅值和信噪比(SNR)的最有效方法。
Study of device noise characteristics of optical addressable potential sensor (LAPS). Through the structural analysis of LAPS semiconductor field effect device, the theoretical model of LAPS is established, and the source, types and characteristics of LAPS device noise signal are further analyzed. Taking the concentration of H ion in pH buffer as test object, a LAPS test system based on NI acquisition card and Labview environment was set up, and the factors such as the wavelength of light source, the modulation frequency of light source, the intensity of light source and the thickness of Si substrate, which affected the noise characteristics of LAPS signal, Simulation and experimental research. The results show that increasing the source and source intensities is the most efficient way to increase the output signal amplitude and signal-to-noise ratio (SNR).