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近日,中国计量科学研究院、中国科学院地质与地球物理研究所及香港科技大学展开的一项联合研究,完成了对单晶硅摩尔质量准确测量,并提出准确测量化学组成的基本原理——物质的量测量均匀性原理。这一结果在国际计量学权威杂志《计量学》(Metrologia)在线发表。
Recently, a joint study by China Institute of Metrology, Institute of Geology and Geophysics, Chinese Academy of Sciences and Hong Kong University of Science and Technology has completed the accurate measurement of the molar mass of monocrystalline silicon and proposed the basic principle of accurate measurement of chemical composition - substance The amount of measurement uniformity principle. The result is published online in Metrologia, an authoritative international metrology journal.