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本文研究了应用多元标准试样及JIS校正常数估算及建立由分析元素和基体元素构成的二元曲线并成功地应用于高合金的分析。文章还对二元曲线的含义、曲线对标样的要求以及方法的稳定性和局限性进行了讨论。
This paper studies the application of multiple standard samples and JIS calibration constants to estimate and establish a binary curve composed of elements and matrix elements and successfully applied to high alloy analysis. The article also discusses the meaning of the binary curve, the requirements of the standard curve and the stability and limitations of the method.