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描述了一种能同时测量半球壳工件内半球和外半球的新型测量机构 ,并对测量机构引起的误差进行了分析 ,给出了其计算方法。
A novel measuring mechanism capable of simultaneously measuring the hemispherical and the outer hemispheres of a hemispherical shell workpiece is described. The error caused by the measuring mechanism is analyzed and its calculation method is given.