Gated-diode相关论文
,Gated-Diode Recombination-Generation Current: a Sensitive Tool for Characterizing Bulk Traps of SOI
In this paper, main characteristicsof the recombination-generation (R-G) current of thebulk traps in SOI gated-diode hav......
FORWARD GATED-DIODE R-G CURRENT METHOD:A SIMPLE NOVEL TECHNIQUE FOR CHARACTERIZING LATERAL LIGHTLY D
该文从挂篮荷载计算、施工流程、支座及临时固结施工、挂篮安装及试验、合拢段施工、模板制作安装、钢筋安装、混凝土的浇筑及养生......
FORWARD GATED-DIODE METHOD FOR EXTRACTING HOT-CARRIER-STRESS-INDUCED BACK INTERFACE TRAPS IN SOI/NMO
该文从挂篮荷载计算、施工流程、支座及临时固结施工、挂篮安装及试验、合拢段施工、模板制作安装、钢筋安装、混凝土的浇筑及养生......
该文从挂篮荷载计算、施工流程、支座及临时固结施工、挂篮安装及试验、合拢段施工、模板制作安装、钢筋安装、混凝土的浇筑及养生......
FORWARD GATED-DIODE R-G CURRENT METHOD:A SIMPLE NOVEL TECHNIQUE FOR CHARACTERIZING LATERAL LIGHTLY D
This paper presents a simple novel technique-forward gated-diode R-G current method-to determine the lateral lightly-dop......
Forward gated-diode Recombination-Generation(R-G) current method is applied to an NMOSFET/SOI to measure the stress-indu......