Based on SIMOS SOI devices, the gate-oxide breakdown effect coupled by channel hot carriers is studied in this paper. It......

本文给出了深亚微米ＭＯＳ器件热载流子效应及可靠性研究与进展，对当前深亚微米ＭＯＳ器件中的主要热载流子现象以及由其引起的器件性能退化的物......