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本书是现代X射线光谱分析综合性参考书。全书共分十七章,系统介绍X射线的物理基础、基本性质、激发、色散、探测与测量,波长色散与能量色散光谱仪,基体效应、光谱背景和谱线重叠,样品制备,定性与半定量分析,实验校正法、数学校正法定量分析,薄膜和镀层厚度分析、应用实例及分析误差与不确定度等内容。附录列举了X射线荧光光谱分析常用的物理常数、相关数据等,供读者参考使用。
This book is a comprehensive reference book of modern X-ray spectrum analysis. The book is divided into seventeen chapters, the system introduces the physical basis of X-ray, the basic nature of excitation, dispersion, detection and measurement, wavelength dispersion and energy dispersive spectrometer, matrix effects, spectral background and spectral overlap, sample preparation, qualitative and semiquantitative Analysis, experimental calibration method, quantitative analysis of mathematical correction, thin film and coating thickness analysis, application examples and analysis of errors and uncertainties and so on. Appendix lists the commonly used X-ray fluorescence spectroscopy of physical constants, related data, for readers reference.