近十年来,国内外的稀土元素X射线荧光光谱分析工作有了很大进展。随着稀土应用的日益广泛,XRF不仅是常量稀土分析手段,也已用于微量和痕量稀土分析。本文着重在样品的预富集,制样技术,仪器条件,校正谱线干扰以及消除基体效应的数学校正法等方面做了阐述。 Over the past decade, great progress has been made in the analysis of rare earth element X-ray fluorescence spectra both at home and abroad. With the increasing use of rare earths, XRF is not only a means of constant rare earth analysis but also has been used for trace and trace rare earth analyzes. This article focuses on the sample pre-enrichment, sample preparation techniques, instrument conditions, the correction of spectral line interference and eliminate the matrix effect of the mathematical correction method and so on are described.