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针尖 样品的距离控制系统是扫描近场红外显微镜的重要组成部分。切变力探测作为一种重要的近场距离控制手段而得到了广泛的应用。介绍了一种对切变力探测系统的改进方法 ,它可以有效地提高石英晶振音叉的品质因数 ,进而提高探测系统对切变力感应的灵敏度。给出了理论分析和实验验证结果
The distance control system for the tip sample is an important part of scanning near-field infrared microscopy. Shear force detection has been widely used as an important control method of near-field distance. An improved method of shear force detection system is introduced, which can effectively improve the quality factor of quartz crystal tuning fork and improve the sensitivity of the detection system to the shear force sensing. The theoretical analysis and experimental verification are given