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在多数情况下,海水中叶绿素垂直分布是不均匀的。次表层叶绿素最大值是其中较为常见的一种形式,普遍存在于大洋及沿岸海域。次表层叶绿素最大值层(SCML)的深度、厚度与强度是表征海洋次表层叶绿素最大值(SCM)现象的主要特征因子,受海洋水文环境、营养盐分布以及浮游植物种类等因素共同影响,在不同季节不同海区的分布有较大差异。总体上,相对近海,大洋中SCML特征因子的季节变化较小,SCML深度较大,厚度较大,强度较小。寡营养盐海区SCML深度及强度的影响因素研究已有较明确结论,SCML深度主要受物理因素(光照条件及水体混合程度)影响,而强度则受物理、生物因素(光照条件、水体混合程度或浮游动物摄食等)共同影响。近海富营养盐海区,SCML特征因子的影响因素研究较为薄弱。长时间序列、高分辨率观测站在相应海区的建立,对推进海洋SCM,尤其是近海SCM的研究有重要意义。卫星观测、现场观测和数学模型相结合,定量研究SCML特征因子与各物理、生物、化学因子的普适性关系,是进一步研究SCML特征因子的重要方向之一。
In most cases, the vertical distribution of chlorophyll in seawater is not uniform. Sub-surface chlorophyll maximum is one of the more common form, common in the ocean and coastal waters. The depth, thickness and intensity of subsurface chlorophyll maximum (SCML) are the main characteristic factors that characterize the SCM of the subsurface of the ocean. Affected by the factors such as the marine hydrological environment, nutrient distribution and phytoplankton species, Different seasons in different sea areas have a greater distribution. In general, SCML characteristic factors in seabed and oceans have smaller seasons, larger SCML depths, larger thicknesses and lower intensities. The research on the influencing factors of SCML depth and intensity in oligotrophic sea area has been made clearer. The depth of SCML is mainly affected by physical factors (light conditions and the degree of water mixing), while the intensity is affected by physical and biological factors (light conditions, degree of water mixing or Zooplankton feeding, etc.) together. Offshore nutrient-rich sea area, SCML characteristic factors are relatively weak. The establishment of long-time and high-resolution observatories in the corresponding sea areas is of great significance for the research on marine SCM, especially for offshore SCM. The combination of satellite observations, field observations and mathematical models to quantitatively study the universal relationship between SCML eigenfactors and various physical, biological and chemical factors is one of the important directions for further study of SCML eigenfactors.