着重介绍了利用耦合谐振环法测量微带基片介电常数和损耗角正切的技术,并通过软件仿真及实物测量验证了该方法的正确性及测量精确度。在1～12GHz频率范围内,介电常数测量不确定度为±3%,损耗角正切测量不确定度为±30%。该方法的测量电路易于制备,对测量环境要求较低,可用于普通的实验室测试。 The technique of measuring the dielectric constant and loss tangent of the microstrip substrate by the coupled resonant ring method is emphatically introduced. The correctness and measurement accuracy of the method are verified by software simulation and real measurement. In the frequency range of 1 ~ 12GHz, the uncertainty of dielectric constant measurement is ± 3% and the measurement uncertainty of loss tangent is ± 30%. The measuring circuit of the method is easy to prepare and has low requirements on the measurement environment and can be used for ordinary laboratory tests.