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本专利介绍一种消色差零透镜检验仪。用这种仪器可检验光学元件的缺陷。这种检验仪利用折射和衍射元件完成非球面元件的检验。用两波长全息技术可降低零透镜检验仪的灵敏度。这种仪器可在光学元件制造到
This patent describes an achromatic zero lens tester. Optical instruments can be used to inspect for defects. This tester uses refraction and diffraction components to complete the inspection of aspherical components. Using two wavelength holographic techniques can reduce the sensitivity of a zero-lens tester. This kind of instrument can be made in optical components