本文提出了一种通过改变线性反馈移位寄存器 (LFSR)的结构实现低功耗内建自测试方法。在伪随机测试方式下 ,随着测试的进行 ,测试矢量的效率大幅降低。通过改变线性反馈移位寄存器的结构滤掉无效的测试矢量从而实现低功耗测试。实践证明 ,改变线性反馈称位寄存器的结构的方法是有效的并且对故障覆盖率没有影响 This paper presents a low-power built-in self-test method by changing the structure of the linear feedback shift register (LFSR). In the pseudo-random test mode, as the test progresses, the efficiency of the test vector is greatly reduced. By changing the structure of the linear feedback shift register to filter out invalid test vectors in order to achieve low-power test. It has been proved that the method of changing the structure of linear feedback scale register is effective and has no effect on fault coverage