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提出一种新颖的方法用于测量电吸收调制器(electroabsorption modulator,EAM)各种因素造成的插入损耗.此方法仅需要测量波长相关的光电流(Iph-λ)和光透过功率(P-λ)的数据,通过最小二乘法拟合出结果.理论分析表明此方法较精确,实验表明测试结果与理论拟合结果自洽得很好.
A novel method is proposed to measure the insertion loss caused by various factors of electroabsorption modulator (EAM). This method only needs to measure the wavelength-dependent photocurrent (Iph-λ) and the light transmission power (P-λ ), And the results are fitted by the least square method.Theoretical analysis shows that this method is more accurate, and the experiment shows that the test results are in good agreement with the theoretical fitting results.