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本文简要叙述了光热偏转光谱技术检测薄膜吸收率的基本原理和定标方法,测量了一系列光学薄膜样品的微弱吸收率。以35mW的氦-氖激光器作为泵浦光源,0.5mW的氦—氖激光器作为测光,以碳黑膜作为标准样品定标得到1×10~(-6)的灵敏度。
In this paper, the basic principle and calibration method for detecting the absorptance of film by photothermal deflection spectroscopy are briefly described. The weak absorptivity of a series of optical thin film samples is measured. The sensitivity of 1 × 10 -6 was obtained by using 35 mW He-Ne laser as the pump light source and 0.5 mW He-Ne laser as the measuring light and the carbon black film as the standard sample.