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对用分子束外延生长的ZnSe-ZnTe应变层超晶格进行了俄歇电子能谱、透射电镜及喇曼散射等分析测试,结果表明材料具有良好的结构与光谱特性。
The analysis of Auger electron spectroscopy, transmission electron microscopy and Raman scattering of the ZnSe-ZnTe strained superlattice using molecular beam epitaxy shows that the material has good structure and spectral characteristics.