第二届国际计量测试仪器展览会于1990年11月9日至15日在北京举行,严济慈副委员长出席了开幕式,并为大会剪彩。参加这届展览会的有国内外六十多家仪器制造厂商,展出了各种计量、测试、分析仪器。美国恩德福克公司展出了各种振动、冲击、压力、声强传感器,仪器和校准设备。振动、冲击传感器有压电式的、压阻式的、集成电路式的、变电容式的。采用扩散硅膜片式结构的角加速 The 2nd International Measurement and Testing Instrument Exhibition was held in Beijing from November 9 to November 15, 1990. Vice chairman Yan Ji Ci attended the opening ceremony and cut the ribbon for the conference. To participate in this exhibition there are more than 60 domestic and foreign instrument manufacturers, exhibited a variety of measurement, testing, analytical instruments. Nidec America exhibited a variety of vibration, impact, pressure, sound intensity sensors, instruments and calibration equipment. Vibration, shock sensors are piezoelectric, piezoresistive, integrated circuit, variable capacitance. Adopt diffuse silicon diaphragm structure angular acceleration