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本文利用理论公式:θ背=90°-1/2tan~(-1)L背/D,θ透=1/2tan~(-1)L透/D和θ背+θ透=90°,设计出一种图表,并提出了设计这种图表的基本理论。使用这种图表既可以直接测定背射劳埃斑点的半衍射角—θ背角,也可以直接测定透射劳埃斑点的θ透角。为了充分发挥仪器的作用,在应用X射线衍射仪进行测试(物相分析等)的同时,仍用线焦点拍照劳埃花样进行了试验。试验结果表明,用线焦点拍照劳埃花样的精度并不比用点焦点的低,却缩短了衍射仪的调机和开机时间。
In this paper, the theoretical formula: θ back = 90 ° -1 / 2 tan -1 L back / D, θ through = 1/2 tan -1 L through / D and θ back + θ through = 90 °, designed A chart, and put forward the basic theory of the design of this chart. Using this chart, you can directly measure the half-diffraction angle-theta-back of the back-Lairé spot, or you can directly measure the θ-angle of the transmitted Lair’s spot. In order to give full play to the role of the instrument, the X-ray diffractometer was used for the test (phase analysis, etc.) at the same time, still use the line focus photographed Laurie pattern was tested. The experimental results show that the accuracy of taking pictures of Lahoe with line focus is no less than that of using point focus, but it shortens the time of adjusting and turning on the diffractometer.