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本文叙述了只用一套噪声测量系统对C波段双极晶体管的噪声系数和功率增益同时测量的原理及方法,并对其误差来源作了简单的分析。
This paper describes the principle and method of simultaneously measuring the noise figure and power gain of a C-band bipolar transistor using only one set of noise measurement systems. The sources of errors are briefly analyzed.