在最佳成象条件下拍摄的高分辨电子显微象可以反映出被观察晶体沿入射电子束方向的结构投影。可是,象上携带的结构信息总免不了遭受各种成象因素的影响而失真。为了从象上提取出更多的结构信息,有必要对象进行各种处理,对于完整晶体的结构象可以首先用平均法消除噪音(1,2,3),提高象的清晰度。更重要的图象 High-resolution electron microscopy taken under optimal imaging conditions can reflect the projected structure of the observed crystal in the direction of the incident electron beam. However, the structure of information carried on the image of the total inevitably suffer a variety of imaging factors and distorted. In order to extract more structural information from the image, it is necessary for the object to carry out various processing. For the complete crystal structure, the averaging method can be used firstly to eliminate the noise (1, 2 and 3) and improve the sharpness of the image. More important image