【摘 要】
：
利用自主研发的SWXRD-1000型短波长x射线衍射仪无损测试了不同热处理工艺条件下纳米铝块体内部残余应力；同时利用Xstress-3000型X射线应力仪对未热处理状态的试样表面的残
【机 构】
：
西南技术工程研究所重庆400039北京理工大学材料学院北京100081
【出 处】
：
第十二届全国X射线衍射学术大会暨国际衍射数据中心(ICDD)研讨会
论文部分内容阅读
利用自主研发的SWXRD-1000型短波长x射线衍射仪无损测试了不同热处理工艺条件下纳米铝块体内部残余应力；同时利用Xstress-3000型X射线应力仪对未热处理状态的试样表面的残余应力进行了测试。结果表明：纳米铝块体内部晶粒取向分布均匀；随着热处理温度的升高,中心处的内部残余应力呈现下降的趋势,径向残余应力由未热处理时的113MPa降低至4MPa,切向残余应力由未热处理时的91MPa降低至38MPa；未热处理试样厚度方向上残余应力分布整体为外压内拉,表面残余应力与内部残余应力具有较好的趋势一致性；直径方向上内部残余应力呈现出中心高、两侧低的趋势,且中心处附近为残余拉应力。
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