论文部分内容阅读
目的探讨X射线衍射里特沃尔德(Rietveld)全谱图拟合法和焦磷酸法测定锡冶炼粉尘中游离二氧化硅(SiO2)水平的差异。方法应用X射线衍射Rietveld全谱图拟合法和焦磷酸法测定同一锡冶炼粉尘中游离SiO2水平,采用配对t检验对2种方法的检测结果进行比较分析。结果焦磷酸法的重现性测定相对标准偏差大于X射线衍射Rietveld全谱图拟合法;焦磷酸法测得的粉尘中游离SiO2水平高于X射线衍射Rietveld全谱图拟合法的测定结果(P<0.05)。结论焦磷酸法在测定含有较多难溶物质的锡冶炼粉尘中的游离SiO2时,可能会导致结果产生较大偏差,应辅以全谱图拟合法进行分析。
OBJECTIVE To investigate the difference of free silica (SiO2) in tin smelting dust by X-ray diffraction Rietveld full spectrum fitting method and pyrophosphate method. Methods X-ray diffraction Rietveld full spectrum fitting method and pyrophosphoric acid method were used to determine the free SiO2 level in the same tin smelting dust. The paired t test was used to compare the two methods. Results The relative standard deviation (RSD) of reproducibility of pyrophosphoric acid method was higher than that of X-ray diffraction Rietveld method. The content of free SiO2 in dust was higher than that of X-ray diffraction Rietveld method (P <0.05). Conclusion Pyrophosphoric acid method may lead to large deviations in the determination of free SiO2 in smelting dust containing more insoluble substances, and should be supplemented by full-spectrum fitting method.