论文部分内容阅读
利用Te溶剂法生长x=0.2的Hg_(1-x)Cd_xTe晶体在300K和77K下的定点霍耳测量。其电阻率ρ的轴向分布和x光萤光光谱法所获x值的轴向分布具有相对应的关系,利用Drude-Lorentz理论和电子有效质量与x值的关系,给予了初步的分析,它为选取适当ρ值范围提供了条件。选取低补偿的样品。验证了理论计算本征载流子浓度和霍耳测量值的一致性,这样便为通过简单的霍耳测量估算响应波长提供理论依据。
Site-specific Hall-measure measurement of Hg_ (1-x) Cd_xTe crystals with x = 0.2 at 300K and 77K using the Te solvent method. The axial distribution of resistivity ρ has a corresponding relationship with the axial distribution of x value obtained by x-ray fluorescence spectroscopy. Based on Drude-Lorentz theory and the relationship between electron effective mass and x value, It provides the conditions for choosing the appropriate range of ρ. Select low-compensated samples. The theoretical calculation of the intrinsic carrier concentration and the consistency of the Hall-effect measurements proves to provide a theoretical basis for estimating the response wavelength through simple Holzer's measurements.