该文研究发现在任意波阵面单色光波照射下的平面光栅还存在自成像。自成像面为与波阵面函数的二阶偏导数有关的空间曲面,且随着自成像与光栅之间距离的增大,像面弯曲加剧。自成像面上条纹密度与波阵面函数的一阶偏导数有关。利用对自成像特性的研究结果,本文还研究了Moire偏折法的基本测试原理和局限性。 The study found that there is self-imaging in plane grating under monochromatic light wave of arbitrary wavefront. The self-imaging surface is a space surface related to the second-order partial derivative of the wavefront function, and as the distance between the self-imaging and the grating increases, the image surface curvature increases. The fringe density on the image plane is related to the first-order partial derivative of the wavefront function. Using the research results of the self-imaging characteristics, this paper also studies the basic testing principles and limitations of the Moire deflection method.