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本文根据背照器件SiO_2层吸收的x射线总剂量所造成的电子损伤,计算了背照器件的寿命。计算值和实验值十分一致。背照器件的有效寿命可达几千小时以上,这在作者的加速寿命试验中得到进一步证实。
In this paper, the lifetime of the back-illuminated device is calculated according to the electron damage caused by the total dose of X-ray absorbed by the SiO 2 layer of the back-illuminated device. Calculated and experimental values are very consistent. The effective lifetime of backlight devices can reach several thousand hours or more, which is further confirmed by the author’s accelerated life test.