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利用LB膜技术对有机分子进行有序组装能够得到厚度可调、规整有序的超薄膜,在分子电子学、非线性光学、生物传感器以及模拟生物膜等方面存在广阔的应用前景,因而一直是人们研究的热点.然而,在研制分子器件的过程中,如何提高LB膜实验的重复性,无损伤检测LB膜的微缺陷结构以及如何有效消除基片对LB膜分子排列结构的影响等问题限制了LB膜的实际应用.要解决这些问题首先必须能够对LB膜的分子排列结构进行分子级观测和表征。最近,扫描隧道显微镜(STM)和原子力显微镜(AFM)因具有原子级分辨而成为表征有机超薄膜分子结构的新型检测手段,用来研究超薄膜的分子有序排列、分子排列的微缺陷结构以及基片与膜的偶合作用。
Using LB film technology to assemble organic molecules in order to obtain ultra-thin film with adjustable thickness and orderly structure, it has broad application prospects in molecular electronics, nonlinear optics, biosensors and simulated biofilms and has been However, in the process of developing molecular devices, how to improve the repeatability of the LB film experiment, to detect the micro-defect structure of the LB film without damage and how to effectively eliminate the influence of the substrate on the molecular arrangement structure of the LB film, etc. The practical application of LB film to solve these problems must first be able to molecular structure of LB film molecular structure observation and characterization. Recently, scanning electron microscopy (STM) and atomic force microscopy (AFM) have become the new detection methods for characterizing the molecular structure of organic ultrathin films by atomic resolution. They are used to study the molecular arrangement of ultrathin films, the micro-defect structure of molecular arrangement and Substrate and film coupling.