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叙述了利用真空紫外光谱确定HL-1装置杂质浓度的方法,详细报告了用于解释光谱测量的杂质输运模型SITCODE。此模型可以计算各个电离态杂质的密度分布以及由杂质引起的电离,轫致辐射和激发等形式的能量损失,该模型是一维的结合新经典与反常输运的杂质输运模型,用模拟的线强度获得了氧的浓度并估计了氧杂质引起的辐射功率,较了不同电子温度和不同反常扩散系数的氧离子密度的径向分布。基于SITCODE,开发了一种杂质浓度的快速分析方法,在每次放电后利用测量的OⅥ103.2nm。线强度可计算出氧浓度,实现杂质浓度的实时分析。对HL-1托卡马克在不同放电情况下杂质浓度进行了测量,且对杂质输运情况进行了研究。
A method for determining the impurity concentration of HL-1 devices by using vacuum ultraviolet spectroscopy is described, and the impurity transport model SITCODE for explaining spectrometry is reported in detail. The model can calculate the density distribution of each ionized impurity and the energy loss in the form of ionization, bremsstrahlung and excitation caused by impurities. The model is a one-dimensional impurity transport model combining neoclassical and anomalous transport. Obtained the oxygen concentration and estimated the radiant power caused by the oxygen impurity, compared with the radial distribution of the oxygen ion density at different electron temperatures and different anomalous diffusion coefficients. Based on SITCODE, a rapid method for the analysis of impurity concentration has been developed using the measured O VI of 103.2 nm after each discharge. Line intensity can be calculated oxygen concentration, real-time analysis of impurity concentration. The impurity concentration of HL-1 tokamak under different discharge conditions was measured, and the impurity transport was studied.