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大会报告 用于评估检出率和可靠性的定量计算模型 3 Donald O. Thompson and Lester W. Schmerr Jr. (美) 贯穿于无损检测中的质量与可靠性 9 J.M.Farley(英 ) 无损评价及其在新世纪中的新作用 15 S.Fukuda(日) 专题报告(1) R.Halmshaw (英) X射线、γ射线和工业射线照相的早期发展史 27 中国射线照相技术的现状 33 Xia Yuzheng(中国) 用X射线辐射谱技术对遮盖固-固界面和半导体器件作非破坏测定 37 E.Z.Kurmaev and V.E.Scherbinin(俄罗斯)
Congress Report Quantitative Calculation Models for Assessing the Detection Outcomes and Reliability 3 Donald O. Thompson and Lester W. Schmerr Jr. Quality and Reliability Throughout Nondestructive Testing 9 JM Farley Nondestructive Evaluation and Its New Role in the New Century 15 S.Fukuda Special Report R.Halmshaw Early Development of X-Ray, Gamma Ray and Industrial Radiography 27 The Current Situation of Radiography in China 33 Xia Yuzheng (China ) Non-Destructive Determination of Covered Solid-Solid Interfaces and Semiconductor Devices by X-Ray Spectroscopy 37 EZKurmaev and VEScherbinin (Russia)